Surface Mount Test Clip

The IC Test-Clip for fast, safe access to Plastic Leaded Chip Carrier (PLCC) style integrated circuits

Our new surface Mount Test Clip is truly the state Of the art for testing Plastic Leaded Chip Carrier (PLCC) style integrated circuits. The unique action wedge design with all four sides opening simultaneously provides a faster and easier attachment to the PLCC.

The helical compression spring and insulating contact combs insure integrity in contact when testing. Our narrow body design allows components to be tested with as little as 2,54 mm (0,1") lead-to-lead spacing, side. Stackable at 0,200" lead-to-lead spacing.

Probe access points are immediately visible for fast and safe individual lead testing, while staggered contact rows on 0,100" centers allow for easy probe attachment and help prevent accidental shorting of adjacent probes, Industry standard .025" square contact pins permit easy attachment of female socket connectors or wire wrapping.