Standard Test Clips

The IC Test-Clip for fast, safe access to DIP Leads

Since 1967 in the market, our Test-Clip has remained the industry standard for faster easier DIP IC Testing, quality control inspection, and field service. AP Test-Clips have become an indispensable tool to the electronic industry.

We're introducing today the industry largest selection of Test-Clips.

With 102 models to fit every size DIP up to 64-pins and both nailed and connector-compatible "headless" leads available in every size, A P Products has just the right Test-Clip to meet your DIP testing requirements.

Get the full Test-Clip catalog here: 

Get the full Test-Clip matrix here: 

"Hands-free" testing
Nail-head pins keep probes and testing leads from sliding off while the offset pin rows allow probes to hang free from longer pinsin top row and not interfere with shorter pins in bottom row. The open nose design permits probe access at DIP leads.

Positive clamping
The heavy duty industrial grade metal springs provide a firm positive grip to the DIP under test. The weight of the probes and test leads can't disturbe connections, eliminating intermittents and false readings.

Reliable contacts
Proven contact wiping action for optimum reliability.
Flat "Duck-Bill" contacts won't roll off narrow DIP leads.
"Knife-Edge" contacts are for elder and greasy DIP leads. These contacts will cut through the coating.
New are "Paint Cut" contacts for ICs with antistatic protection coating, as often used in military applications. These contacts will cut through the protective coating. Stripping the coat prior to testing is no longer necessary. The test marks can easily touched up after testing.

Save way to test
The contact comb fits between DIP leads to eliminate any possibility of shorting out chips.

Rugged construction
Body material is tough, engineering grade glass filled thermoplastic. Hinge design with steel pivot pin for smooth, long lasting use.

Specifications:

Specification Sheets: